Slip avalanches in a fiber bundle model

We study slip avalanches in disordered materials under an increasing external load in the framework of a fiber bundle model. Over-stressed fibers of the model do not break, instead they relax in a stick-slip event which may trigger an entire slip avalanche. Slip avalanches are characterized by the number slipping fibers, by the slip length, and by the load increment, which triggers the avalanche. Our calculations revealed that all three quantities are characterized by power law distributions with universal exponents. We show by analytical calculations and computer simulations that varying the amount of disorder of slip thresholds and the number of allowed slips of fibers, the system exhibits a disorder induced phase transition from a phase where only small avalanches are formed to another one where a macroscopic slip appears.Comment: 6 pages, 6 figure

Bose-Einstein Condensate Dark Matter Halos confronted with galactic rotation curves

We present a comparative confrontation of both the Bose-Einstein Condensate (BEC) and the Navarro-Frenk-White (NFW) dark halo models with galactic rotation curves. We employ 6 High Surface Brightness (HSB), 6 Low Surface Brightness (LSB), and 7 dwarf galaxies with rotation curves falling into two classes. In the first class rotational velocities increase with radius over the observed range.The BEC and NFW models give comparable fits for HSB and LSB galaxies of this type, while for dwarf galaxies the fit is significantly better with the BEC model. In the second class the rotational velocity of HSB and LSB galaxies exhibits long flat plateaus, resulting in better fit with the NFW model for HSB galaxies and comparable fits for LSB galaxies. We conclude that due to its central density cusp avoidance the BEC model fits better dwarf galaxy dark matter distribution. Nevertheless it suffers from sharp cutoff in larger galaxies, where the NFW model performs better. The investigated galaxy sample obeys the Tully-Fisher relation, including the particular characteristics exhibited by dwarf galaxies. In both models the fitting enforces a relation between dark matter parameters: the characteristic density and the corresponding characteristic distance scale with an inverse power.Comment: published versio

E-BLOW: E-Beam Lithography Overlapping aware Stencil Planning for MCC System

Electron beam lithography (EBL) is a promising maskless solution for the technology beyond 14nm logic node. To overcome its throughput limitation, recently the traditional EBL system is extended into MCC system. %to further improve the throughput. In this paper, we present E-BLOW, a tool to solve the overlapping aware stencil planning (OSP) problems in MCC system. E-BLOW is integrated with several novel speedup techniques, i.e., successive relaxation, dynamic programming and KD-Tree based clustering, to achieve a good performance in terms of runtime and solution quality. Experimental results show that, compared with previous works, E-BLOW demonstrates better performance for both conventional EBL system and MCC system